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c3f4d99e57
* Group tests for profiling instrumentation together, NFC This will make it easier to test changes to the code coverage logic. There are a handful of tests which relate to profiling which I have not moved. These include tests for the driver and for the SIL optimizer. It makes more sense to keep those tests where they are. * Rename a test file, NFC This file tests code coverage of primary files, so I've changed the name of the file to reflect that. * Simplify the check lines in a test, NFC This file tests code coverage of closures. It had several check lines which obscured the meaning of the test, and its check lines were in a strange order. Remove the extra checks and disable -emit-sorted-sil.
16 lines
623 B
Swift
16 lines
623 B
Swift
// RUN: %target-swift-frontend -Xllvm -sil-full-demangle -suppress-warnings -profile-generate -profile-coverage-mapping -emit-sorted-sil -emit-sil -module-name coverage_deinit %s | %FileCheck %s
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// REQUIRES: objc_interop
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import Foundation
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public class Derived: NSString {
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// CHECK-LABEL: sil @$S15coverage_deinit7DerivedCfD
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// CHECK: builtin "int_instrprof_increment"
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// CHECK-NEXT: super_method {{.*}} : $Derived, #NSString.deinit!deallocator.foreign
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deinit {
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}
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}
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// CHECK-LABEL: sil_coverage_map "{{.*}}coverage_deinit.swift" $S15coverage_deinit7DerivedCfD
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// CHECK-NEXT: [[@LINE-5]]:10 -> [[@LINE-4]]:4 : 0
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